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Effective Resistance of a Two Layer Mesh

Kose, S ; Friedman, E. G

IEEE Transactions on Circuits and Systems II: Express Briefs, November 2011, Vol.58(11), pp.739-743 [Peer Reviewed Journal]

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A Distributed Filter Within a Switching Converter for Application to 3-D Integrated Circuits

Rosenfeld, J ; Friedman, E G

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, June 2011, Vol.19(6), pp.1075-1085 [Peer Reviewed Journal]

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Power Network Optimization Based on Link Breaking Methodology

Jakushokas, R ; Friedman, E. G

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, May 2013, Vol.21(5), pp.983-987 [Peer Reviewed Journal]

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Multi-Layer Interdigitated Power Distribution Networks

Jakushokas, R ; Friedman, E G

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, May 2011, Vol.19(5), pp.774-786 [Peer Reviewed Journal]

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Linear and Switch-Mode Conversion in 3-D Circuits

Rosenfeld, J ; Friedman, E. G

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, November 2011, Vol.19(11), pp.2095-2108 [Peer Reviewed Journal]

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Distributed On-Chip Power Delivery

Kose, S ; Friedman, E. G

IEEE Journal on Emerging and Selected Topics in Circuits and Systems, December 2012, Vol.2(4), pp.704-713 [Peer Reviewed Journal]

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Clock Distribution Networks in 3-D Integrated Systems

Pavlidis, V. F ; Savidis, I ; Friedman, E. G

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, December 2011, Vol.19(12), pp.2256-2266 [Peer Reviewed Journal]

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Power Noise in TSV-Based 3-D Integrated Circuits

Savidis, I ; Kose, S ; Friedman, E. G

IEEE Journal of Solid-State Circuits, February 2013, Vol.48(2), pp.587-597 [Peer Reviewed Journal]

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TEAM: ThrEshold Adaptive Memristor Model

Kvatinsky, S ; Friedman, E. G ; Kolodny, A ; Weiser, U. C

IEEE Transactions on Circuits and Systems I: Regular Papers, January 2013, Vol.60(1), pp.211-221 [Peer Reviewed Journal]

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Active Filter-Based Hybrid On-Chip DC-DC Converter for Point-of-Load Voltage Regulation

Kose, Selcuk ; Tam, S ; Pinzon, S ; Mcdermott, B ; Friedman, E. G

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, April 2013, Vol.21(4), pp.680-691 [Peer Reviewed Journal]

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