skip to main content

Results 1 - 10 of 12  for Great Falls College MSU

Results 1 2 next page
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Material Type:
Book
Add to e-Shelf

Discover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA

International Test Conference Corporate Author IEEE Computer Society Test Technology Technical Committee Content Provider; Institute of Electrical and Electronics Engineers Philadelphia Section. Content Provider; International Test Conference 1992

Test Conference, IEEE International

Online access

2
Material Type:
Book
Add to e-Shelf

Designing, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA

International Test Conference Corporate Author IEEE Computer Society Test Technology Technical Committee Content Provider; Institute of Electrical and Electronics Engineers Philadelphia Section. Content Provider; International Test Conference 1993

Online access

3
Material Type:
Book
Add to e-Shelf

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author Rajsuman, Rochit Contributor; IEEE Computer Society Test Technology Technical Committee Content Provider; IEEE Computer Society Technical Committee on VLSI, Content Provider; IEEE International Workshop on Memory Technology, Design, and Testing 1994

Online access

4
Material Type:
Book
Add to e-Shelf

Memory Technology, Design and Testing, 1997: IEEE International Workshop on (MTDT '97).

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author Rajsuman, Rochit Contributor; Lombardi, Fabrizio Contributor; Wik, T Contributor; IEEE Computer Society Technical Committee on VLSI, Content Provider; IEEE Computer Society Test Technology Technical Committee Content Provider; IEEE International Workshop on Memory Technology, Design, and Testing 1997

Online access

5
Material Type:
Book
Add to e-Shelf

Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California

IEEE International Workshop on Memory Testing Corporate Author Rajsuman, Rochit Contributor; IEEE Computer Society Test Technology Technical Committee Content Provider; IEEE International Workshop on Memory Testing 1993

Online access

6
Material Type:
Book
Add to e-Shelf

1999 IEEE International Conference on Microelectronic Systems Education (MSE'99) : systems education in the 21st century : July 19-21, 1999, Arlington, Virginia, USA : proceedings

IEEE International Conference on Microelectronic Systems Education Corporate Author IEEE Computer Society Technical Committee on VLSI, Content Provider; IEEE Computer Society Design Automation Technical Committee Content Provider; IEEE Computer Society Test Technology Technical Committee Content Provider; IEEE International Conference on Microelectronic Systems Education 1999

Online access

7
Material Type:
Book
Add to e-Shelf

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

IEEE International Workshop on Memory Technology, Design and Testing Corporate Author Rajsuman, Rochit Contributor; Rajkanan, K Contributor; IEEE Computer Society Test Technology Technical Committee Content Provider; IEEE Computer Society Technical Committee on VLSI, Content Provider; IEEE International Workshop on Memory Technology, Design, and Testing 1995

Online access

8
Material Type:
Book
Add to e-Shelf

Proceedings

International Test Conference Corporate Author IEEE Computer Society Test Technology Technical Committee Content Provider; Institute of Electrical and Electronics Engineers Philadelphia Section. Content Provider; International Test Conference 1995

Test Conference, IEEE International

Online access

9
Material Type:
Book
Add to e-Shelf

Proceedings

International Test Conference Corporate Author Institute of Electrical and Electronics Engineers Philadelphia Section. Content Provider; IEEE Computer Society Test Technology Technical Committee Content Provider; International Test Conference 1996

Test Conference, IEEE International

Online access

10
Material Type:
Book
Add to e-Shelf

The changing philosophy of test : International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC

International Test Conference Corporate Author IEEE Computer Society Philadelphia Chapter. Content Provider; IEEE Computer Society Test Technology Technical Committee Content Provider; International Test Conference 1990

Online access

Results 1 - 10 of 12  for Great Falls College MSU

Results 1 2 next page

Personalize your results

  1. Edit

Refine Search Results

Expand My Results

  1.   

Searching Remote Databases, Please Wait