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Unstable expression of recombinant antibody during long-term culture of CHO cells is accompanied by histone H3 hypoacetylation

Paredes, Verenice ; Park, Jeong ; Jeong, Yongsu ; Yoon, Jaeseung ; Baek, Kwanghee

Biotechnology Letters, 2013, Vol.35(7), pp.987-993 [Peer Reviewed Journal]

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An Efficient Authentication Scheme to Protect User Privacy in Seamless Big Data Services

Jeong, Yoon-Su ; Shin, Seung-Soo

Wireless Personal Communications, 2016, Vol.86(1), pp.7-19 [Peer Reviewed Journal]

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On the design of a disturbance observer for moving target tracking of an autonomous surveillance robot

Lee, Man ; Park, Hyung ; Lee, Won ; Lee, Kil ; Jeong, Weui ; Yoon, Kang ; Chun, Ho ; Choi, Keun

International Journal of Control, Automation and Systems, 2012, Vol.10(1), pp.117-125 [Peer Reviewed Journal]

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Access Control Protocol Based on Privacy Property of Patient in m-Healthcare Emergency

Jeong, Yoon-Su ; Lee, Sang-Ho ; Shin, Seung-Soo Jeong, Yoon-Su (correspondence author)

Wireless Personal Communications, Dec 1, 2014, Vol.79(4), pp.2565-2578 [Peer Reviewed Journal]

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Analytic Model of S/D Series Resistance in Trigate FinFETs With Polygonal Epitaxy

Chang-Woo Sohn ; Chang Yong Kang ; Myung-Dong Ko ; Do-Young Choi ; Hyun Chul Sagong ; Eui-Young Jeong ; Chan-Hoon Park ; Sang-Hyun Lee ; Ye-Ram Kim ; Chang-Ki Baek ; Jeong-Soo Lee ; Lee, J. C ; Yoon-Ha Jeong

IEEE Transactions on Electron Devices, April 2013, Vol.60(4), pp.1302-1309 [Peer Reviewed Journal]

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Synthesis of Hollow Conductive Polypyrrole Balls by the Functionalized Polystyrene as Template

Chang, Choo Hwan ; Son, Pyung Soo ; Yoon, Jeong-Ah ; Choi, Seong-Ho Wang, Xiaogong

Journal of Nanomaterials, 2010, Vol.2010, 6 pages [Peer Reviewed Journal]

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Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET

Chan-Hoon Park ; Myung-Dong Ko ; Ki-Hyun Kim ; Sang-Hyun Lee ; Jun-Sik Yoon ; Jeong-Soo Lee ; Yoon-Ha Jeong

IEEE Electron Device Letters, November 2012, Vol.33(11), pp.1538-1540 [Peer Reviewed Journal]

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Interfacial-Layer-Driven Dielectric Degradation and Breakdown of HfSiON/SiON Gate Dielectric nMOSFETs

Do-Young Choi ; Kyong Taek Lee ; Chang-Ki Baek ; Chang Woo Sohn ; Hyun Chul Sagong ; Eui-Young Jung ; Jeong-Soo Lee ; Yoon-Ha Jeong

IEEE Electron Device Letters, October 2011, Vol.32(10), pp.1319-1321 [Peer Reviewed Journal]

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Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer

Sang-Hyun Lee ; Ye-Ram Kim ; Jae-Ho Hong ; Eui-Young Jeong ; Jun-Sik Yoon ; Chang-Ki Baek ; Dong-Won Kim ; Jeong-Soo Lee ; Yoon-Ha Jeong

IEEE Electron Device Letters, July 2014, Vol.35(7), pp.702-704 [Peer Reviewed Journal]

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New Investigation of Hot-Carrier Degradation on RF Small-Signal Parameter and Performance in High- k/Metal-Gate nMOSFETs

Hyun Chul Sagong ; Chang Yong Kang ; Chang-Woo Sohn ; Do-Young Choi ; Eui-Young Jeong ; Chang-Ki Baek ; Jeong-Soo Lee ; Yoon-Ha Jeong

IEEE Electron Device Letters, December 2011, Vol.32(12), pp.1668-1670 [Peer Reviewed Journal]

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